Accurion develops and manufactures advanced solutions for challenging measurement tasks with its two divisions thin film characterization and active vibration isolation.
As the leader in instrumentation for Imaging Ellipsometry, Brewster Angle Microscopy and UV/VIS reflectometry, we specialize in optical analysis of monolayers and nano films on microstructures.
We provide active vibration isolation systems to remove ambient vibrations from sensitive measuring equipment for more precise results.
The 11th Workshop of Ellipsometry (WSE) will take place at the campus in Steyr of the FH Upper Austria – University of Applied Sciences Upper Austria, from September 6 to 8, 2021.
We are pleased to announce our participation at ECIS2021 in Athens from Sept 5-10.
Sun et al. (2021) - Real-time imaging of Na+ reversible intercalation in “Janus” graphene stacks for battery applications
We are expanding our headquarters in Goettingen, Germany. Check out the construction phases of our new annex for more storage…
Florian et al. (2021) - Single Femtosecond Laser-Pulse-Induced Superficial Amorphization and Re-Crystallization of Silicon