Accurion develops and manufactures advanced solutions for challenging measurement tasks with its two divisions thin film characterization and active vibration isolation.
YOUR CHALLENGE IS OUR MOTIVATION
Accurion develops and manufactures advanced solutions for challenging measurement tasks with its two divisions thin film characterization and active vibration isolation.
Thin Film Characterization
Thin Film Characterization
IMAGING ELLIPSOMETRY
As the leader in instrumentation for Imaging Ellipsometry, Brewster Angle Microscopy and UV/VIS reflectometry, we specialize in optical analysis of monolayers and nano films on microstructures.
As the leader in instrumentation for Imaging Ellipsometry, Brewster Angle Microscopy and UV/VIS reflectometry, we specialize in optical analysis of monolayers and nano films on microstructures.
The 11th Workshop of Ellipsometry (WSE) will take place at the campus in Steyr of the FH Upper Austria – University of Applied Sciences Upper Austria, from September 6 to 8, 2021.
Florian et al. (2021) - Single Femtosecond Laser-Pulse-Induced Superficial Amorphization and Re-Crystallization of Silicon
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