/ Accurion

Graphene on SiO2/Si

Graphene on SiO2/Si

2D material on glass

2D material on glass

2D microcrystallite with monolayer

2D microcrystallite with monolayer

Hetero-Structure MoS2/WSe2

Hetero-Structure MoS2/WSe2

Flake search for mono- and trilayer

Flake search for mono- and trilayer

What is unique about an imaging ellipsometer?

Spectroscopic ellipsometric measurements on flakes of 2D-materials with sizes down to 1µm
Microscopic maps of thickness distribution and refractive indices from 190-1700nm
Ellipsometric contrast micrographs (ECM) enable increased contrast imaging over e.g. optical microscopy to visualize layer numbers and inhomogeneities
Non-destructive measurements on transparent substrates using knife edge illumination to prevent unwanted backside reflections

Advantages of imaging ellipsometry over other techniques

Imaging spectroscopic ellipsometry can be applied to characterize graphene and other 2D-materials. CVD grown, exfoliated and epitaxially grown flakes of 2D-materials are analyzed with the imaging ellipsometer ep4.

Imaging of monolayers on different substrates
Determination of the optical dispersion
Distinction between mono-, bi- or n-layers
Automatic flakesearch algorithm for identification of monolayers or well-defined thickness regions
Exploration of heterostructures
Quality control by detecting defects and special aspects of 2D nanoplates

Downloads
Literature

2D Materials Compendium: Graphene and 2D-Materials (pdf)

2D Materials Beyond Graphene_Microscopic Characterization of 2D Materials by SIE (pdf)

2D Materials Characterisation of 2D Materials by SIE and RSE (pdf)

2D Materials Imaging Ellipsometry as a Tool for Characterization of 2D Materials on Various Substrates (pdf)

2D Materials Full scale wafer analysis by imaging ellipsometry and ellipsometric contrast micrography (PDF)

Transition Metal Chalcogenides Spectroscopic Ellipsometry and Optical Constants of MoS2 Flakes (pdf)

Black Phosphorus Imaging Mueller Matrix Ellipsometry for Anisotropic Samples of Black Phosphorus (PDF)

Graphene Characterization of Graphene through Imaging Spectroscopic Ellipsometry (PDF)

Graphene Graphene on Cu (pdf)

Heterostructures MoS2-WSe2 Investigated by Imaging Ellipsometry (pdf)

Flake search Automatic Localization of Mono- to N-Layers 2D Materials by Spectroscopic Imaging Ellipsometry (PDF)

2D Materials Fast, Noncontact, Wafer-Scale, Atomic Layer Resolved Imaging of Two-Dimensional Materials by Ellipsometric Contrast Micrography

Flake Search Spectroscopic Imaging Ellipsometry for Automated Search of Flakes of Mono- and N-Layers of 2D Materials

Graphene Characterization of Thermally Reduced Graphene Oxide by Imaging Ellipsometry

Graphene High Resolution Imaging of Few-Layer Graphene

Graphene Imaging Ellipsometry of Graphene

Graphene Spectroscopic Imaging Ellipsometry and Fano Resonance Modeling of Graphene

Transition Metal Chalcogenides Manifold Coupling Mechanisms of Transition Metal Dichalcogenides to Plasmic Gold Nanoparticle Arrays

Transition Metal Chalcogenides Giant Optical Anisotropy in Transition Metal Dichalcogenides for Next-Generation Photonics

Transition Metal Chalcogenides Imaging Spectroscopic Ellipsometry of MoS2

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