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Director Operativo

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Senior Application Specialist

Phone: +49-551-9996020

Mail: pt@accurion.com

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Daniela Bogner

Sales Manager

Phone: +49-551-9996013

Mail: db@accurion.com

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Sales Manager

Phone: +49-551-9996016

Mail: lth@accurion.com

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Sebastian Funke

Application Specialist, 2D Materials

Phone: +49-551-999600

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Dr. Christian Hoffmann

Application Specialist for Biological Applications

Phone: +49-551-9996021

Mail: cho@accurion.com

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Director General

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Sales and Application

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Frank Zuo

Sales and Application

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Service and LB-Application Specialist

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Product Manager

Phone: +49-551-9996015

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Service Engineer

Phone: +49-551-9996023

Mail: service-halcyonics@accurion.com

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Application Overview Halcyonics Products

In this section, you will find pre-selected technologies and products matched to the most typical active vibration isolation solution we provide, based on our experience with a wide range of vibration sensitive equipment. Please be aware that this list will not show a complete overview of technologies and products within this technologies. We want to provide an overview for technologies and products where we have made experiences over the last 15 years.
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Scanning Probe Microscopy - SPM

Supplier
Technology
Product
Suggestion Halcyonics System

Ellipsometry

Ellipsometry is an optical technique for the investigation of the dielectric properties (complex refractive index or dielectric function) of thin films. Upon the analysis of the change of polarization of light, which is reflected off a sample, ellipsometry can yield information about layers that are thinner than the wavelength of the probing light itself, even down to a single atomic layer. The technology is non-destructive and contactless. Ellipsometry can probe the complex refractive index and film thickness.

There are two types of ellipsometer commercially available: imaging and non-imaging ellipsometer.
 
Imaging Ellipsometer are using a CCD camera as a detector and provide a real time contrast image of the sample. The tickness resolution of ellipsometers are in the Angstöm level. The lateral resolution on non imaging ellipsometer are downt to 30-50 microns, the lateral resolution of non imaging ellipsometers can go down to 1 micron
Supplier
Technology
Product
Suggestion Halcyonics System

Brewster Angle Microscopy

A Brewster Angle Microscop is dedicated to visualize the surface of ultrathin films.

At a special angle known as Brewster's angle, no p-polarized light is reflected from the surface, thus all reflected light must be s-polarized, with an electric field perpendicular to the plane of incidence.

Supplier
Technology
Product
Suggestion Halcyonics System

Spectrometry

Reflection spectroscopy is technology for the investigation of the orientation, association, adsorption and chemical change of chromophores in monolayers at the air-water interface.

Supplier
Technology
Product
Suggestion Halcyonics System

Langmuir-Blodgett trough

A Langmuir-Blodgett trough is a laboratory apparatus that is used to compress monolayers of molecules on the surface of a given subphase (usually water) and measures surface phenomena due to this compression. It can also be used to deposit single or multiple monolayers on a solid substrate.

Supplier
Technology
Product
Suggestion Halcyonics System

Tensiometer

 

The term tensiometer applies to a devices to measure the surface tension of liquids. Surface tension is a property of the surface of a liquid that allows it to resist an external force.

The Wilhelmy Plate tensiometer requires a plate to make contact with the liquid surface. It is widely considered the simplest and most accurate method for surface tension measurement.

A Wilhelmy plate is a thin plate that is used to measure equilibrium surface or interfacial tension at an air–liquid or liquid–liquid interface. In this method, the plate is oriented perpendicular to the interface, and the force exerted on it is measured.

 

Supplier
Technology
Product
Suggestion Halcyonics System

Profilometry

Profilometer is a measuring instrument used to measure a surface's profile, in order to quantify its roughness.

Supplier
Technology
Product
Suggestion Halcyonics System

Digital Holography

Supplier
Technology
Product
Suggestion Halcyonics System

Nanoindentation

Nanoindentation is a variety of indentation hardness tests applied to small volumes. Indentation is perhaps the most commonly applied means of testing the mechanical properties of materials. A nanoindenter is the main component for indentation hardness tests used in nanoindentation.

 

There are many types of nanoindenters in current use differing mainly on their tip geometry. Among the numerous available geometries are three and four sided pyramids, wedges, cones, cylinders, filaments, and spheres.

Supplier
Technology
Product
Suggestion Halcyonics System

Raman Microscopy

Raman spectroscopy is a spectroscopic technique used to study vibrational, rotational, and other low-frequency modes in a system. It relies on inelastic scattering, or Raman scattering, of monochromatic light, usually from a laser in the visible, near infrared, or near ultraviolet range. The laser light interacts with molecular vibrations, phonons or other excitations in the system, resulting in the energy of the laser photons being shifted up or down. The shift in energy gives information about the vibrational modes in the system.

 

Several variations of Raman spectroscopy have been developed. The usual purpose is to enhance the sensitivity, e.g., surface-enhanced Raman (SERS), to improve the spatial resolution, to acquire very specific information (resonance Raman). Another variation is the tip enhanced raman spectroscopy (TERS).

Supplier
Technology
Product
Suggestion Halcyonics System

Patch clamping

The patch clamp technique is a laboratory technique in electrophysiology that allows the study of single or multiple ion channels in cells.

 

  • technology for micromanipulation of cells
Supplier
Technology
Product
Suggestion Halcyonics System

Scanning Electron Microscopy - SEM

An electron microscope is a type of microscope that uses a particle beam of electrons to illuminate the specimen and produce a magnified image. Electron microscopes (EM) have a greater resolving power than a light-powered optical microscope, because electrons have wavelengths about 100,000 times shorter than visible light (photons), and can achieve better than 50 pm resolution.

 

The electron microscope uses electrostatic and electromagnetic "lenses" to control the electron beam and focus it to form an image. These lenses are analogous to, but different from the glass lenses of an optical microscope that form a magnified image by focusing light on or through the specimen.

Established types of electron microscopes are:

  • Transmission electron microscope (TEM)
  • Scanning electron microscope (SEM)
  • Reflection electron microscope (REM)
  • Scanning transmission electron microscope (STEM)
  • Low-voltage electron microscope (LVEM)

There are also several spcial set ups in the market, such as: HeIM Helium ion microscope (SHIM), Focused Ion Beam (FIB), Field Emission Gun (FEG), Field Emission (FE)

 

Supplier
Technology
Product
Suggestion Halcyonics System

Laser Scanning Microscopy

Supplier
Technology
Product
Suggestion Halcyonics System

Confocal Microscopy

Confocal microscopy is an optical imaging technique used to increase optical resolution and contrast of a micrograph by using point illumination and a spatial pinhole to eliminate out-of-focus light in specimens that are thicker than the focal plane. It enables the reconstruction of three-dimensional structures from the obtained images.

 

Three types of confocal microscopes are commercially available:

  • Confocal laser scanning microscopes (CLSM)
  • Spinning-disk confocal microscopes (Nipkow)
  • Programmable Array Microscopes (PAM)

Further used explanations are used: Digital Confocal Microscope (DCM), Digital Resolution Microscope (DRM), spinning disc confocal solutions (SDCS)

Supplier
Technology
Product
Suggestion Halcyonics System

Inverted Microscopy

An inverted microscope is a microscope with its light source and condenser on the top, above the stage pointing down, while the objectives and turret are below the stage pointing up.

Supplier
Technology
Product
Suggestion Halcyonics System

Fluorescence Microscopy

The specimen is illuminated with light of a specific wavelength (or wavelengths) which is absorbed by the fluorophores, causing them to emit light of longer wavelengths (i.e. of a different color than the absorbed light). The illumination light is separated from the much weaker emitted fluorescence through the use of a spectral emission filter.

 

Some set ups use X-ray fluorescence analysis (XRF)

 

Supplier
Technology
Product
Suggestion Halcyonics System
Agilent Technologies
AFM
Agilent Technologies
AFM
Agilent Technologies
Bio AFM
Agilent Technologies
AFM (large sample)
A.P.E. Research
AFM
Nanonics Imaging Ltd.
AFM
Anasys Instruments
AFM
Witec GmbH
AFM
Witec GmbH
AFM/Raman
Witec GmbH
AFM/Raman (large sample)
Witec GmbH
SNOM
Sensolytics GmbH
SECM
AlphaContec
AFM
AlphaContec
SNOM
JPK Instruments
Bio AFM
Bruker Nano
Bio AFM
Bruker Nano
AFM
Nanotec Electronica
AFM
AIST-NT
AFM
Asylum Research
AFM
Bruker Nano
AFM
Bruker Nano
AFM
Danish Micro Engineering
AFM
Danish Micro Engineering
AFM
anish Micro Engineering
AFM
NanoSurf AG
AFM/STM
Anfatec
AFM
Novascan Technologies, Inc.
AFM
depends on use, please contact us for a recommendation
NanoSurf AG
AFM
depends on use, please ask for a special recommendation
Anfatec
AFM
Bruker Nano
AFM
Anfatec
AFM
Asylum Research
Bio AFM
Asylum Research
AFM Confocal
Asylum Research
AFM
NanoSurf AG
AFM
Bruker Nano
AFM
Breitmeier Messtechnik GmbH
AFM
Nanonics Imaging Ltd.
SNOM/Confocal
Bruker Nano
AFM
NanoSurf AG
AFM
depends on use, please ask for a special recommendation
NT-MDT Co.
AFM
Anasys Instruments
AFM/IR
JPK Instruments
AFM/Raman
JPK Instruments
Bio AFM
JPK Instruments
AFM
NT-MDT Co.
AFM
NT-MDT Co.
Bio AFM
NT-MDT Co.
AFM (large sample)
NT-MDT Co.
AFM
NT-MDT Co.
SNOM
NT-MDT Co.
AFM/Raman
NT-MDT Co.
AFM
NT-MDT Co.
AFM/Ultramicrotome
Park Systems Corp.
AFM
Ambios Technology
AFM
AIST-NT
AFM/STM
NT-MDT Co.
AFM/STM
NT-MDT Co.
AFM
A.P.E. Research
SNOM
AFM Workshop
AFM
Park Systems Corp.
AFM
Park Systems Corp.
AFM
Park Systems Corp.
AFM (large sample)
Park Systems Corp.
AFM
Park Systems Corp.
Bio AFM
Park Systems Corp.
SNOM
Accurion GmbH
Spectroscopic Imaging Ellipsometer
nanofilm_ep4
Biolin Scientific
Brewster Angle Microscope
Accurion GmbH
Brewster Angle Microscope
Accurion GmbH
Brewster Angle Microscope
Accurion GmbH
Reflection spectrometer
Biolin Scientific
Langmuir-Blodgett trough
Biolin Scientific
Langmuir-Blodgett trough
on request
Biolin Scientific
Langmuir-Blodgett trough
Kibron Inc.
Langmuir-Blodgett trough
Kibron Inc.
Langmuir-Blodgett trough
Kibron Inc.
Tensiometer
on request
Kibron Inc.
Tensiometer
KRÜSS GmbH
Processor Tensiometer
KRÜSS GmbH
Single Fibre Tensiometer
Biolin Scientific
Force Tensiometer
Biolin Scientific
Optical Tensiometer
on request
Bruker AXS
Optical Profilometer/WLI
Bruker AXS
Stylus Profilometer
Alicona Imaging GmbH
Optical 3D measurement system
Alicona Imaging GmbH
Optical Profiler + 3D Micro Coordinate System
Solarius Development Inc.
Optical Profilometer
Leica Microsystems
Optical 3D measurement system
AEP Technology
Stylus Profilometer
depends on use, please contact us for a recommendation
AEP Technology
Optical Profilometer/WLI
depends on use, please contact us for a recommendation
Uniscan Instruments
Optical Profilometer
FOGALE nanotech
Optical Profilometer/WLI
Sensofar-Tech, S.L.
Optical Imaging Profilometer
Sensofar-Tech, S.L.
3D Optical Profilometer
Sensofar-Tech, S.L.
Aspheric Optical Profilometer
Sensofar-Tech, S.L.
3D Optical Profilometer
Taylor Hobson Ltd
Optical Profilometer
Breitmeier Messtechnik GmbH
Optical Profilometer/WLI
WLI
Lyncée Tec SA
Digital holographic microscopy
Lyncée Tec SA
Digital holographic microscopy
Asylum Research
Nanoindenter
MFP
Agilent Technologies
Nanoindenter
ASMEC GmbH
Nanoindenter
Witec GmbH
Confocal Raman Microscope
Thermo Fisher Scientific Inc.
Raman Microscope
AIST-NT
Raman/Fluorescence Spectroscope + AFM
Bruker Optics
Raman Microscope Spectrometer
Luigs & Neumann
Micromanipulation
Agilent Technologies
Field Emission Scanning Electron Microscope
Carl Zeiss Microscopy GmbH
Focused Ion Beam Scanning Electron Microscope
Carl Zeiss Microscopy GmbH
Scanning Electron Microscope
Hitachi High-Technologies
Focused Ion Beam Scanning Electron Microscope
FEI Company
Scanning Electron Microscope
JEOL
Scanning Electron Microscope
JEOL
Focused Ion Beam Scanning Electron Microscope
JEOL
Scanning Electron Microscope
JEOL
Field Emission Scanning Electron Microscope
JEOL
Field Emission Scanning Electron Microscope
FEI Company
Scanning Electron Microscope
Carl Zeiss Microscopy GmbH
Field Emission Scanning Electron Microscope
FEI Company
Scanning Electron Microscope
FEI Company
Dual Beam Scanning Electron Microscope
FEI Company
Scanning Electron Microscope
Hitachi High-Technologies
Scanning Electron Microscope
Hitachi High-Technologies
Scanning Electron Microscope
Carl Zeiss Microscopy GmbH
Field Emission Scanning Electron Microscope
Hitachi High-Technologies
Scanning Electron Microscope
Hitachi High-Technologies
Field Emission Scanning Electron Microscope
Hitachi High-Technologies
Field Emission Scanning Electron Microscope
Hitachi High-Technologies
Field Emission Scanning Electron Microscope
Carl Zeiss Microscopy GmbH
Field Emission Scanning Electron Microscope
Carl Zeiss Microscopy GmbH
Field Emission Scanning Electron Microscope
Tescan
Scanning Electron Microscope
FEI Company
Scanning Electron Microscope
FEI Company
Dual Beam Scanning Electron Microscope
FEI Company
Focused Ion Beam Scanning Electron Microscope
Keyence
3D-Laser Scanning Microscope
Nikon Instruments
Confocal Laser Microscope
A1
Carl Zeiss Microscopy GmbH
Confocal Microscope
Olympus
Confocal Laser Scanning Microscope
Carl Zeiss Microscopy GmbH
Confocal Laser Scanning Microscope
Quorum Technologies Inc.
Spinning Disc Confocal Microscope
Leica Microsystems
Confocal Laser Scanning Microscope
Carl Zeiss Microscopy GmbH
Inverted Microscope
Carl Zeiss Microscopy GmbH
Inverted Microscope
Carl Zeiss Microscopy GmbH
Inverted Microscope
Leica Microsystems
Inverted Microscope
Leica Microsystems
Inverted Microscope
Nikon Instruments
Inverted Microscope
Nikon Instruments
Inverted Microscope
Olympus
Inverted Microscope
Keyence
Fluorescence Microscope
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