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Marcus Liemen - Business Development Accurion

Marcus Liemen

Business Development

Phone:

Mail: ml@accurion.com

Dr. Peter Thiesen - Senior Application Specialist Accurion

Dr. Peter Thiesen

Senior Application Specialist

Phone: +49-551-9996020

Mail: pt@accurion.com

Daniela Bogner - Sales Manager Accurion

Daniela Bogner

Sales Manager

Phone: +49-551-9996013

Mail: db@accurion.com

Linda Thieme - Sales Manager Accurion

Linda Thieme

Sales Manager

Phone: +49-551-9996016

Mail: lth@accurion.com

Sebastian Funke - Application Specialist, 2D Materials Accurion

Sebastian Funke

Application Specialist, 2D Materials

Phone: +49-551-999600

Mail: sfu@accurion.com

Dr. Christian Hoffmann - Application Specialist for Biological Applications Accurion

Dr. Christian Hoffmann

Application Specialist for Biological Applications

Phone: +49-551-9996021

Mail: cho@accurion.com

Stephan Ferneding - Chief Executive Officer Accurion

Stephan Ferneding

Chief Executive Officer

Phone: +49-551-999600

Mail:

Narayana Sharma - Sales and Application Accurion

Narayana Sharma

Sales and Application

Phone: +91-98450 04273

Mail: sharma@accurion.com

Frank Zuo - Sales and Application Accurion

Frank Zuo

Sales and Application

Phone: +86-21 5017 9099

Mail: fz@accurion.cn

Dr. Antonio Gonzalez - Service and LB-Application Specialist Accurion

Dr. Antonio Gonzalez

Service and LB-Application Specialist

Phone: +49-551-9996035

Mail: ago@accurion.com

Arash Mirhamed - Product Manager Accurion

Arash Mirhamed

Product Manager

Phone: +49-551-9996015

Mail: am@accurion.com

Holger Grube - Service Engineer Accurion

Holger Grube

Service Engineer

Phone: +49-551-9996023

Mail: service-halcyonics@accurion.com

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Transparent Substrates

YouTube-Video - Knife Edge Illumination - Beam Cutter

www.accurion.com

The video explains the working principle of knife edge illumination and practical handling of nanofilm_knife edge_ep4 setup.

Characterization of Thin Films on Transparent Substrates with Imaging Ellipsometry (Poster, 2015)

Poster, WSE2015, Twente Univ.

Thin films on transparent substrates are of increasing interest in advanced technologies like flexible displays, plastic solar cells, functional windows or new concepts in illumination. State of the art in thin film metrology is spectroscopic ellipsometry, but transparent substrates are still an issue because of the backside reflected light that after a long pathway through a transparent substrate gets incoherent or partly coherent with the consequence that the phase information gets completely or partly lost and the determination of metrological parameters of the layer of interest is difficult or impossible. A number of workarounds are established to get rid of backside reflection, like mechanical grinder or a number of different treats of the backside with different types of tape, with glues, with toothpaste etc. A number of these approaches are working well but in most cases, the sample cannot be used for further investigations.

 

 

 

Silicon Dioxide Nanoparticle Patterns on Transparent Substrates Characterized by Spectroscopic Imaging Ellipsometry and Atomic Force Microscopy ( Poster, 2015)

Poster, WSE2015, Twente Univ.

The tailored organization of nanoparticles at interfaces is of increasing technical and scientific interest. Silicon-dioxide nanoparticles (SiO2 NPs) may be used for applications which require transparent surface coatings or functional surface patterns for the visible range of the electromagnetic spectrum, e.g. super-hydrophobic anti-reflection coatings on glass slides1. In this work, printed line-shaped patterns of aggregates of SiO2 NPs on glass substrates were characterized by means of spectroscopic imaging ellipsometry and atomic force microscopy (AFM). The determination of the layer-thickness profiles with peak heights on the sub-micron scale was a matter of particular interest. We applied spectroscopic imaging ellipsometry in this proof-ofprinciple study to show that imaging ellipsometry is capable of the characterization of SiO2 nanoparticle patterns, even on transparent substrates

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