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- AFM for Research and Surface Analysis
- Small Sample AFM
- Large Sample AFM
- Vacuum Environment AFM
- AFM Probes and Options
- AFM for In-line Metrology
- AFM for Wafer Fabs
- AFM for Flat Panel Display
- Photomask Repair
- Optical Profilometry
- Nano Infrared Spectroscopy
- Ellipsometry for Thin Film Characterization
- Imaging Spectroscopic Ellipsometry
- Referenced Spectroscopic Ellipsometry
- Brewster Angle Microscopy
- Surface Inspection Metrology
- Nanofilm Accessories
- Active Vibration Isolation
- Benchtop Isolation Tables
- Modular Isolation Elements
- Laboratory Tables
- Acoustic Enclosures
- Heavy Load Platforms and Isolation Elements
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- Park SmartScan™
- Park SmartLitho™
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News

Apr 08, 2021

New annex at headquarters

We are expanding our headquarters in Goettingen, Germany. Check out the construction phases of our new annex for more storage space!

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