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Latest paper in cooperation with Accurion

Florian et al. (2021) - Single Femtosecond Laser-Pulse-Induced Superficial Amorphization and Re-Crystallization of Silicon

Delve into the fascinating subject of Silicon-wafer surface modification by ultra-short laser pulses. Accurion’s EP4 Imaging Ellipsometer emerged as the perfect tool to provide state-of-the-art insights in this field of research.

(Paper by researches from the Bundesanstalt für Materialforschung und Prüfung Berlin, Princeton University, Friedrich-Schiller-Universität Jena, Technische Universität Chemnitz and Accurion GmbH)