Applications

Cantilever of Atomic Force Microscope Scanning Probe Microscopy
Hardness Tester Nanoindentation
Microchip investigation by digital microscopy Digital Microscopy
Optical 3D surface measurement system 3D Surface Metrology
Confocal scanning microscope for biological samples Confocal Microscopy
Artificial Insemination Micromanipulation
Scanning Electron Microscope Electron Microscopy
Mass Photometry
Leica DCM8 on i4 large
Lumicks AFS on i4
Sensofar Q vix on i4 medium
LNP3 DC on i4
Refeyn One on i4
JEOL Neoscope on i4
Nanosurf DriveAFM and inverted microscope on i4
Molecular Vista One on i4
Bruker JPK NanoWizard BioAFM and inverted microscope on i4
Keyence VHX-6000 on i4
Molecular Vista 75 on Nano30
CSI Nano-Observer on Nano 20
Polytec TopMap on Vario Basic
Nikon Ti2 on IVF Workstation
Neaspec neaSNOM on Workstation Vario with Acoustic Enclosure
LEXT OLS5100 3D-Laser-Scanning-Microscope on Workstation i4

Performance Demonstration

SiC wafer with graphene
(FoV: 0,5 µm x 0,5µm)
Floating monolayer of ethyl stearate
(FoV: 400 µm x 400 µm)
Polymer drop on silicon substrate
(FoV: 50 µm x 50 µm)
Gold on carbon
(FoV: 1,51 µm x 1,51 µm)

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Accurion GmbH became a family of Park Systems Corp.

Following the acquisition by Park Systems Corporation, Accurion GmbH is now Park Systems GmbH as of December 19th, 2022. As a member of Park Systems Corporation, Accurion Division, Park Systems GmbH will continue serving its customers without any interruption, and conduct its current production, sales, and service activities as usual until any further notice.
With added resources and merged synergy, Park Systems GmbH promises to deliver enhanced solutions and services to its customers with revamped technology and wider sales and service network.